New built-in self-test scheme for SoC interconnect
vastutusandmed
Artur Jutman, Raimund Ubar, and Jaan Raik
allikas
The 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV
ilmumiskoht
[Orlando]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 19-24 : ill
ISBN
980-6560-56-6
märkused
Bibliogr.: 26 ref
TTÜ struktuuriüksus
keel
inglise
Jutman, A., Ubar, R.-J., Raik, J. New built-in self-test scheme for SoC interconnect // The 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV. [Orlando] : International Institute of Informatics and Systemics, 2005. p. 19-24 : ill.