20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002 (allikas)

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  • artikkel kogumikus
    Teaching digital RT-level self-test using a Java appletDevadze, Sergei; Jutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 20022002 / p. 322-328 : ill
    artikkel kogumikus
  • artikkel kogumikus
    Testability guided hierarchical test generation with decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Nõmmeots, Tanel20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 20022002 / p. 265-271
    artikkel kogumikus
Kirjeid leitud 2, kuvan 1 - 2