prindi

Analysis of a test method for delay faults in NoC interconnects

autor
Bengtsson, Tomas
Jutman, Artur
Kumar, Shashi
Ubar, Raimund-Johannes
Peng, Zebo
vastutusandmed
Tomas Bengtsson, Artur Jutman, Shashi Kumar, Raimund Ubar, Zebo Peng
allikas
Proceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 2006
ilmumiskoht
Kharkov
kirjastus/väljaandja
Kharkov National University of Radioelectronics
ilmumisaasta
2006
leheküljed
p. 42-46 : ill
märksõna
integraallülitused
testimine
ISBN
966-659-124-3
märkused
Bibliogr.: 17 ref
keel
inglise
Bengtsson, T., Jutman, A., Kumar, S., Ubar, R.-J., Peng, Z. Analysis of a test method for delay faults in NoC interconnects // Proceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 2006. Kharkov : Kharkov National University of Radioelectronics, 2006. p. 42-46 : ill.