Система генерирования тестов для микропроцессоров
author
Ubar, Raimund-Johannes
Dušina, Julia
Zaugarov, Viktor
Крупнова Е.
Storožev, Sergei
statement of authorship
Р.Убар, Ю.Душина, В.Заугаров, Е.Крупнова, С.Сторожев
source
Proceedings of international conference "Technical Diagnostics-93", St.-Peterburg, June 8-10, 1993
location of publication
St.-Peterburg
year of publication
1993
pages
p. 87-89
subject term
mikroprotsessorid
testid
language
vene