A novel fault-tolerant logic style with self-checking capability
author
Taheri, Mahdi
Sheikhpour, Saeideh
Mahani, Ali
Jenihhin, Maksim
statement of authorship
Taheri, Mahdi, Sheikhpour, Saeideh, Mahani, Ali, Jenihhin, Maksim
source
Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022
location of publication
Piscataway, New Jersey
publisher
IEEE
year of publication
2022
pages
art. 183305 : ill
conference name, date
28th IEEE International Symposium on On-Line Testing and Robust System Design, 12-14 Sept. 2022
conference location
Torino, Italy
url
https://doi.org/10.1109/IOLTS56730.2022.9897818
subject term
elektronahelad
veaavastus
enesekontroll
Scopus
Scopus
keyword
Digital circuits
error detection
logic level
self-checking
ISBN
978-166547355-2
notes
Bibliogr.: 27 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
3.1
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems