Measurement of charge carrier lifetime temperature-dependence in 4H-SiC power diodes
author
Udal, Andres
Velmre, Enn
statement of authorship
A.Udal, E.Velmre
source
Proceedings of the International Conference on Silicon Carbide and Related Materials - 1999 (ICSCRM'99) : Research Triangle Park, North-Carolina, USA, Oct. 10-15, 1999. Vol. 1
location of publication
[S. l.]
publisher
Trans Tech Publications
year of publication
2000
pages
p. 781-784
url
https://www.scientific.net/MSF.338-342.781
subject term
dioodid
eluiga
temperatuur
mõõtmine
TalTech department
elektroonikainstituut
language
inglise