SiC-diode forward surge current failure mechanisms : experiment and simulation
author
statement of authorship
E. Velmre, A. Udal
source
ESREF'97 : proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct. 7-10, 1997, Bordeaux, France
location of publication
[S.l.]
year of publication
pages
p. 1671-1674
language
inglise
Velmre, E., Udal, A. SiC-diode forward surge current failure mechanisms : experiment and simulation // ESREF'97 : proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct. 7-10, 1997, Bordeaux, France. [S.l.], 1997. p. 1671-1674.