Systematic unsupervised recycled field-programmable gate array detection
author
Isaka, Yuya
Shintani, Michihiro
Ahmed, Foisal
Inoue, Michiko
statement of authorship
Yuya Isaka, Michihiro Shintani, Foisal Ahmed and Michiko Inoue
source
IEEE transactions on device and materials reliability
publisher
IEEE
journal volume number month
vol. 22, 2
year of publication
2022
pages
10 p. : ill
url
https://doi.org/10.1109/TDMR.2022.3164788
subject term
programmeeritav ventiilmaatriks
ostsillaatorid
keyword
direct density ratio estimation
process variation
recycled FPGA detection
ring oscillator
ISSN
1530-4388
notes
Bibliogr.: 31 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/26049
https://www.scopus.com/record/display.uri?eid=2-s2.0-85127747038&origin=inward&txGid=3198fc47a697d91dd3b9d6fe2fbe8c2f
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20T%20DEVICE%20MAT%20RE&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000808073600012
category (general)
Engineering
Tehnika
Materials science
Materjaliteadus
category (sub)
Engineering. Safety, risk, reliability and quality
Tehnika. Ohutus, risk, töökindlus ja kvaliteet
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
Materials science. Electronic, optical and magnetic materials
Materjaliteadus. Elektroonilised, optilised ja magnetilised materjalid
quartile
Q2
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)