High speed data preprocessing for bioimpedance measurements : architectural exploration
                                            author
                                    
                                    
                                
                                            statement of authorship
                                    
                                    
P.Ellervee, P.Annus, M.Min
                                                    
                                            
                                            source
                                    
                                    
The 27th NORCHIP Conference : Trondheim, Norway, November 2009
                                                    
                                            
                                            location of publication
                                    
                                    
[S.l.]
                                                    
                                            
                                            publisher
                                    
                                    
                                
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
[4] p
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                            Ellervee, P., Annus, P., Min, M. High speed data preprocessing for bioimpedance measurements : architectural exploration // The 27th NORCHIP Conference : Trondheim, Norway, November 2009. [S.l.] : IEEE, 2009. [4] p.