Identifying untestable faults in sequential circuits using test path constraints
author
Viilukas, Taavi
Karputkin, Anton
Raik, Jaan
Jenihhin, Maksim
Ubar, Raimund-Johannes
Fujiwara, Hideo
statement of authorship
Taavi Viilukas, Anton Karputkin, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Hideo Fujiwara
source
Journal of electronic testing : theory and applications (JETTA)
journal volume number month
Vol. 28, 4
year of publication
2012
pages
p. 511-521 : ill
url
https://link.springer.com/article/10.1007/s10836-012-5312-5
subject term
elektriahelad
vead
diagnostika (tehnika)
keyword
automated test pattern generation
untestable faults
register-transfer level
ISSN
0923-8174
notes
Bibliogr.: 23 ref
language
inglise