Automated design error debug using high-level decision diagrams and mutation operators
author
Raik, Jaan
Repinski, Urmas
Tšepurov, Anton
Hantson, Hanno
Ubar, Raimund-Johannes
Jenihhin, Maksim
statement of authorship
Jaan Raik, Urmas Repinski, Anton Chepurov, Hanno Hantson, Raimund Ubar, Maksim Jenihhin
source
Microprocessors and microsystems
journal volume number month
Vol. 37, 4-5
year of publication
2013
pages
p. 505-513 : ill
conference name, date
28th NORCHIP Conference, November 15-16, 2010
conference location
Tampere, Finland
subject term
integraallülitused
arvuti arhitektuur
vead
otsustusdiagrammid
algoritmid
programmeerimiskeeled
keyword
design errors
debug
mutation operators
high-level decision diagrams
ISSN
0141-9331
notes
Bibliogr.: 29 ref
Special issue on NORCHIP 2012
TTÜ department
arvutitehnika instituut
language
inglise