Test configurations for diagnosing faulty links in NoC switches
author
Raik, Jaan
Ubar, Raimund-Johannes
Govind, Vineeth
statement of authorship
Jaan Raik, Raimund Ubar, Vineeth Govind
source
12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings
location of publication
Los Alamitos
publisher
IEEE Computer Society Press
year of publication
2007
pages
p. 29-34 : ill
conference name, date
12th IEEE European Test Symposium ETS 2007, 20-24 May, 2007
conference location
Freiburg, Germany
url
http://dx.doi.org/10.1109/ETS.2007.41
subject term
integraallülitused
rikked
kompuutersimulatsioon
ISSN
1530-1877
ISBN
978-0-7695-2827-4
notes
Bibliogr.: 17 ref
TalTech department
arvutitehnika instituut
language
inglise