Identification and rejuvenation of NBTI-critical paths in nanoscale logic circuits
author
Jenihhin, Maksim
statement of authorship
Maksim Jenihhin
source
1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems : May 28-29, 2015, Cluj-Napoca, Romania
location of publication
[Cluj-Napoca]
publisher
Technical University of Cluj-Napoca
year of publication
2015
pages
[1] p
conference name, date
1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems, May 28-29, 2015
conference location
Cluj-Napoca, Romania
subject term
elektronlülitused
loogikaelemendid
diagnostika (tehnika)
TalTech department
arvutitehnika instituut
language
inglise