Analysis of peak current for current crowding effect in 4H- and 6H-SiC Schottky structures
author
Kurel, Raido
Rang, Toomas
statement of authorship
R.Kurel, T.Rang
source
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
location of publication
[Tallinn]
publisher
Tallinn Technical University
year of publication
2000
pages
p. 235-236 : ill
ISBN
9985-59-179-8
notes
Bibliogr.: 5 ref