Detection efficiency calibration of Si-SPAD detectors via comparison with a Si-standard diode

statement of authorship
Dhoska, K., Hofer, H., López, M., Rodiek, B., Kübarsepp, T. & Kück, S.
location of publication
Tallinn
year of publication
pages
p. 110-115 : ill
conference name, date
11h International Conference of DAAAM Baltic Industrial Engineering, 20-22 April, 2016
conference location
Tallinn, Estonia
ISSN
2346-612X
ISBN
978-9949-23-987-0
notes
Bibliogr.: 6 ref
TalTech department
language
inglise