IEEE 1687 compliant ecosystem for embedded instrumentation access and in-field health monitoring

statement of authorship
Anton Tsertov, Artur Jutman, Konstantin Shibin, Sergei Devadze
location of publication
Piscataway
publisher
year of publication
pages
9 p.: ill
conference name, date
IEEE AUTOTESTCON 2018, National Harbor, September 17-20, 2018
conference location
Maryland, USA
subject of form
ISSN
1558-4550
ISBN
978-1-5386-5223-7
notes
Bibliogr.: 13 ref
TalTech department
language
inglise