Investigation of charge carrier lifetime temperature-dependence in 4H-SiC diodes
author
Velmre, Enn
Udal, Andres
statement of authorship
Andres Udal and Enn Velmre
source
Silicon carbide and related materials 2006
location of publication
[S.l.]
publisher
Trans Tech Publications
year of publication
2007
pages
p. 375-378
url
https://www.researchgate.net/publication/250348987_Investigation_of_Charge_Carrier_Lifetime_Temperature-Dependence_in_4H-SiC_Diodes
subject term
dioodid
ränikarbiid
temperatuur
simulatsioon
notes
(Materials Science Forum, ISSN 1662-9752 ; 556/557)
TalTech department
elektroonikainstituut
language
inglise