Statistical Analysis-Based Feature Selection for Anomaly Detection in AIS Dataset

statement of authorship
Gabor Visky, Risto Vaarandi, Sokratis Katsikas, Olaf Maennel
source
2025 IEEE 23rd World Symposium on Applied Machine Intelligence and Informatics (SAMI)
publisher
year of publication
pages
6 p. : ill
conference name, date
2025 IEEE 23rd World Symposium on Applied Machine Intelligence and Informatics (SAMI), 23-25 Jan. 2025
conference location
Stará Lesná, Slovakia
ISSN
2767-9438
ISBN
979-8-3503-7936-5
notes
Bibliogr.: 31 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
language
inglise