Combinational fault simulation in sequential circuits
author
Ubar, Raimund-Johannes
Kõusaar, Jaak
Gorev, Maksim
Devadze, Sergei
statement of authorship
Raimund Ubar, Jaak Kõusaar, Maksim Gorev, Sergei Devadze
source
2015 IEEE International Symposium on Circuits and Systems : 24-27 May 2015, Lisboa, Portugal : [proceedings]
location of publication
Piscataway, New Jersey
publisher
IEEE
year of publication
2015
pages
p. 2876-2879 : ill
conference name, date
2015 IEEE International Symposium on Circuits and Systems, 24-27 May, 2015
conference location
Lisboa, Portugal
url
https://doi.org/10.1109/ISCAS.2015.7169287
subject term
elektronlülitused
rikked
diagnostika (tehnika)
kompuutersimulatsioon
algoritmid
Scopus
https://www.scopus.com/sourceid/56190
https://www.scopus.com/record/display.uri?eid=2-s2.0-84946223399&origin=inward&txGid=6955ad8431487055d89ab5316f7fd94c
WOS
https://www.webofscience.com/wos/woscc/full-record/WOS:000371471003040
quartile
Q3
category (general)
Engineering
Tehnika
category (sub)
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
keyword
sequential circuits
stuck-at-faults
design for testability
fault simulation with critical path tracing
ISSN
0271-4310
ISBN
978-1-4799-8391-9
notes
Bibliogr.: 16 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutitehnika instituut
language
inglise