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SEU study of wideband heterostructure diode for particle detection

author
Patankar, Udayan Sunil
Koel, Ants
statement of authorship
Udayan Sunil Patankar, Ants Koel
source
2021 IEEE International Conference on Consumer Electronics (ICCE)
publisher
IEEE
year of publication
2021
pages
4 p. : ill
conference name, date
ICCE-2021 IEEE International Conference on Consumer Electronics, CES, January 10-12, 2021
conference location
Las Vegas, NV, USA
url
https://doi.org/10.1109/ICCE50685.2021.9427613
subject term
jõuelektroonika
karbiidid
dioodid
Scopus
Conference Proceedings at Scopus
Article at Scopus
WOS
Article at WOS
quartile
Q3
category (general)
Engineering
category (sub)
Engineering. Industrial and manufacturing engineering
Engineering. Electrical and electronic engineering
keyword
Silicon Carbide (SiC)
Single Event Upset (SEU)
Wideband
Diode
Power Electronics
ISSN
2158-4001
ISBN
978-1-7281-9766-1
notes
Bibliogr.: 30 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
Thomas Johann Seebecki elektroonikainstituut
language
inglise
Reserch Group
Cognitronic lab-on-a-chip research group
Research laboratory for cognitronics
Patankar, U., Koel, A. SEU study of wideband heterostructure diode for particle detection // 2021 IEEE International Conference on Consumer Electronics (ICCE). : IEEE, 2021. 4 p. : ill. https://doi.org/10.1109/ICCE50685.2021.9427613