Laes, K., Bereznev, S., Tverjanovich, A., Borisov, E.N., Varema, T., Volobujeva, O., Öpik, A.*

Shallow defect density determination in CuIn3Se5 thin film photoabsorber by impedance spectroscopy

author

Laes, Kristjan

Bereznev, Sergei

Tverjanovich, Andrey

Borisov, Evgeny N.

Varema, Tiit

Volobujeva, Olga

Öpik, Andres

statement of authorship

Kristjan Laes, Sergei Bereznev, A.Tverjanovich, E.N.Borisov, Tiit Varema, Olga Volobujeva, Andres Öpik

source

Thin solid films

journal volume number month

517

year of publication

2009

pages

p. 2286-2290 : ill

subject term

õhukesed kiled

vaskindiumseleniid

impedantsspektroskoopia

ISSN

0040-6090

notes

Bibliogr.: 12 ref

language

inglise

Laes, K., Bereznev, S., Tverjanovich, A., Borisov, E.N., Varema, T., Volobujeva, O., Öpik, A.* Shallow defect density determination in CuIn3Se5 thin film photoabsorber by impedance spectroscopy // Thin solid films (2009) 517, p. 2286-2290 : ill.