Investigation of the silicon/polypyrrole interface by pulsed photoluminescence and IR spectroscopic ellipsometry during electrochemical deposition
                                            statement of authorship
                                    
                                    
Xin Zhang, Vitali Syritski, Guoguang Sun, Karsten Hinrichs and Jörg Rappich
                                                    
                                            
                                            journal volume number month
                                    
                                    
Vol. 24, S1
                                                    
                                            
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 171
                                                    
                                            
                                            conference name, date
                                    
                                    
12th International PAT Conference, 29 September–2 October, 2013
                                                    
                                            
                                            conference location
                                    
                                    
Berlin, Germany
                                                    
                                            
                                            ISSN
                                    
                                    
1042-7147
                                                    
                                            
                                            notes
                                    
                                    
Bibliogr.: 6 ref
                                                    
                                                    
Special Issue: 12th International PAT Conference, 29 September–2 October, 2013, Berlin, Germany
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                                            TalTech department
                                    
                                    
                                
                            Zhang, X., Sõritski, V., Sun, G., Hinrichs, K., Rappich, J. Investigation of the silicon/polypyrrole interface by pulsed photoluminescence and IR spectroscopic ellipsometry during electrochemical deposition // Polymers for advanced technologies (2013) Vol. 24, S1, p. 171.