Impurity interaction with point defects in the Si-SiO2 structures and its influence on the interface properties
author
Kropman, Daniel
Mellikov, Enn
Kärner, T.
Ugaste, Ülo
Laas, Tõnu
Heinmaa, I.
Medvid, A.
statement of authorship
D.Kropman, E.Mellikov, T.Kärner, Ü.Ugaste, T.Laas, I.Heinmaa, A.Medvid
source
Materials science and engineering : B
journal volume number month
134
year of publication
2006
pages
p. 222-226 : ill
url
https://www.sciencedirect.com/science/article/pii/S0921510706004375
subject term
punktdefektid
räni
räniühendid
ränidioksiid
struktuur
vesinik
tuumamagnetresonantsspektroskoopia
ISSN
0921-5107
notes
Bibliogr.: 8 ref
language
inglise