DefSim-based exercises for studying defects in CMOS gates
author
Jutman, Artur
Pleskacz, Witold A.
Boiko, Nikolai
Ubar, Raimund-Johannes
statement of authorship
Artur Jutman, Witold Pleskacz, Nikolai Boiko, Raimund Ubar
source
EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden
location of publication
Stockholm
publisher
Royal Institute of Technology
year of publication
2006
pages
p. 23-26 : ill
ISBN
91-7178-402-0
notes
Bibliogr.: 8 ref