Interaction of point defects with impurities in the Si-SiO2 system and its influence on the properties of the interface
author
Kropman, Daniel
Mellikov, Enn
Öpik, Andres
Lott, Kalju
Kärner, T.
Heinmaa, I.
Laas, Tõnu
Medvid, A.
Skroupa, W.
Prucnal, S.
Rebohle, L.
Zvyagin, S.
Cizmar, E.
Ozerov, M.
Wosnitsa, J.
statement of authorship
D.Kropman, E.Mellikov, A.Öpik, K.Lott, T.Kärner, I.Heinmaa, T.Laas, A.Medvid, W.Skroupa, S.Prucnal, L.Rebohle, S.Zvyagin, E.Cizmar, M.Ozerov, J.Wosnitsa
source
Thin solid films
journal volume number month
Vol. 518
year of publication
2010
pages
9, p. 2374-2376
url
https://www.sciencedirect.com/science/article/abs/pii/S0040609009014564
subject term
õhukesed kiled
tuumamagnetresonants
magnetresonants
ISSN
0040-6090
language
inglise