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Keynote: cost-efficient reliability for Edge-AI chips

author
Jenihhin, Maksim
Taheri, Mahdi
Cherezova, Natalia
Ahmadilivani, Mohammad Hasan
Selg, Hardi
Jutman, Artur
Shibin, Konstantin
Tsertov, Anton
Devadze, Sergei
Kodamanchili, Rama Mounika
Rafiq, Ahsan
Raik, Jaan
Daneshtalab, Masoud
statement of authorship
Maksim Jenihhin, Mahdi Taheri, Natalia Cherezova, Mohammad Hasan Ahmadilivani, Hardi Selg, Artur Jutman
source
2024 IEEE 25th Latin American Test Symposium (LATS)
location of publication
Piscataway, New Jersey
publisher
IEEE
year of publication
2024
conference name, date
25th IEEE Latin American Test Symposium, LATS 2024, 9-12 April 2024
conference location
Maceio, Brazil
url
https://doi.org/10.1109/LATS62223.2024.10534610
subject term
riistvara
tehisintellekt
andmevood
Scopus
Article at Scopus
keyword
AxC
DNNs
edge AI
edge computing
HW accelerators
reliability assessment and enhancement
soft errors
ISBN
979-835036555-9
notes
Bibliogr.: 13 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise
Jenihhin, M., Taheri, M., Cherezova, N., Ahmadilivani, M.H., Selg, H., Jutman, A., Shibin, K., Tsertov, A., Devadze, S., Kodamanchili, R.M., Rafiq, A., Raik, J., Daneshtalab, M. Keynote: cost-efficient reliability for Edge-AI chips // 2024 IEEE 25th Latin American Test Symposium (LATS). Piscataway, New Jersey : IEEE, 2024. https://doi.org/10.1109/LATS62223.2024.10534610