Failure prediction of power devices under reverse surge current conditions
author
Freidin, Boris
Velmre, Enn
Udal, Andres
statement of authorship
Boris Freydin, Enn Velmre, and Andres Udal
source
ISPSD’92 : Proceedings of the 4th International Symposium on Power Semiconductor Devices & Ics, Waseda University, Tokyo, Japan, 19-21 May 1992
location of publication
Tokyo
publisher
IEEE
year of publication
1992
pages
p. 118-123 : ill
conference name, date
The 4th International Symposium on Power Semiconductor Devices, May 1992
conference location
Waseda University, Tokyo
url
https://doi.org//10.1109/ISPSD.1992.991247
subject term
pooljuhtseadised
jõuseadised
töökindlus
keyword
Surges
Temperature dependence
Poisson equations
Nonlinear equations
Doping
Electronic packaging thermal management
Semiconductor device packaging
Semiconductor devices
Semiconductor diodes
Charge carrier processes
notes
Bibliogr.: 15 ref
TalTech department
elektroonikainstituut