Hierarchical calculation of malicious faults for evaluating the fault-tolerance
author
Ubar, Raimund-Johannes
Devadze, Sergei
Jenihhin, Maksim
Raik, Jaan
Jervan, Gert
Ellervee, Peeter
statement of authorship
Raimund Ubar, Sergei Devadze, Maksim Jenihhin, Jaan Raik, Gert Jervan, Peeter Ellervee
source
Proceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China
location of publication
Los Alamitos
publisher
IEEE Computer Society
year of publication
2008
pages
p. 222-227 : ill
url
https://ieeexplore.ieee.org/document/4459544
subject term
tõrketaluvus
rikked
simulatsioon
otsustusdiagrammid
ISBN
978-0-7695-3110-6
notes
Bibliogr.: 14 ref
language
inglise