Effective scalable IEEE 1687 instrumentation network for fault management
author
Jutman, Artur
Shibin, Konstantin
Devadze, Sergei
statement of authorship
Artur Jutman and Konstantin Shibin, Sergei Devadze
source
IEEE design & test
publisher
IEEE
journal volume number month
Vol. 30, 5
year of publication
2013
pages
p. 26-35 : ill
url
https://doi.org/10.1109/MDAT.2013.2278535
subject term
rikked
tõrketaluvus
standardid (normid)
ISSN
2168-2356
notes
Bibliogr.: 12 ref
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/21100286806
https://www.scopus.com/record/display.uri?eid=2-s2.0-84900025438&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FMDAT.2013.2278535%29&sessionSearchId=47e771afcc769678348f9a5b62e06fdd&relpos=0
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2013
https://www.webofscience.com/wos/woscc/full-record/WOS:000328974800004
category (general)
Engineering
Tehnika
Computer science
Arvutiteadus
category (sub)
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
Computer science. Hardware and architecture
Arvutiteadus. Riistvara ja arhitektuur
Computer science. Software
Arvutiteadus. Tarkvara
quartile
Q1
TalTech department
arvutitehnika instituut
language
inglise