Optimization of boundary scan tests using FPGA-based efficient scan architectures
author
Aleksejev, Igor
Devadze, Sergei
Jutman, Artur
Shibin, Konstantin
statement of authorship
Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin
source
Journal of electronic testing : theory and applications (JETTA)
publisher
Springer
journal volume number month
vol. 32, 3
year of publication
2016
pages
p. 245-255 : ill
url
https://doi.org/10.1007/s10836-016-5588-y
subject term
diagnostika (tehnika)
skaneerimine
katseseadmed
digitaaltehnika
programmeeritav ventiilmaatriks
väliprogrammeeritav loogika
keyword
boundary scan
reconfigurable scan-chain
embedded instrumentation
FPGA
ISSN
0923-8174
notes
Bibliogr.: 23 ref
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/18040
https://www.scopus.com/record/display.uri?eid=2-s2.0-84964452131&origin=inward&txGid=035b6825dd1a37b925ec9c823fcecd7d
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=J%20ELECTRON%20TEST&year=2016
https://www.webofscience.com/wos/woscc/full-record/WOS:000377449900002
category (general)
Engineering
Tehnika
category (sub)
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
quartile
Q2
TalTech department
arvutitehnika instituut
language
inglise