CMOS defects analysis using DefSim measurement environment
author
Pleskacz, Witold A.
Borejko, Tomasz
Walkanis, A.
Stopjakova, Viera
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
W.A.Pleskacz, T.Borejko, A.Walkanis, V.Stopjakova, A.Jutman, R.Ubar
source
Informal Digest of Papers : Eleventh IEEE European Test Symposium : ETS 2006 : 21-24 May 2006, Southampton, United Kingdom
location of publication
Southampton
year of publication
2006
pages
p. 241-246 : ill
notes
Bibliogr.: 12 ref