Virtual reconfigurable scan-chains on FPGAs for optimized board test
author
Aleksejev, Igor
Jutman, Artur
Devadze, Sergei
Shibin, Konstantin
statement of authorship
Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin
source
2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015
location of publication
[S.l.]
publisher
IEEE
year of publication
2015
pages
[6] p. : ill
conference name, date
16th Latin American Test Symposium, 25-27 March, 2015
conference location
Puerto Vallarta, Mexico
url
http://dx.doi.org/10.1109/LATW.2015.7102411
subject term
väliprogrammeeritav loogika
katseseadmed
diagnostika (tehnika)
keyword
boundary scan
reconfigurable scan-chain
ISSN
2373-0862
ISBN
978-1-4673-6711-0
notes
Bibliogr.: 13 ref
TalTech department
arvutitehnika instituut
language
inglise