print

Defect-oriented modul-level fault diagnosis in digital circuits

author
Kostin, Sergei
Ubar, Raimund-Johannes
Raik, Jaan
statement of authorship
Sergei Kostin, Raimund Ubar, Jaan Raik
source
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany
location of publication
[S.l.]
publisher
IEEE
year of publication
2011
pages
p. 81-86
conference name, date
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011
conference location
Gottbus, Germany
subject term
digitaalelektroonika
digitaalintegraallülitused
rikked
diagnostika (tehnika)
ISBN
978-1-4244-9753-9
notes
Bibliogr.: 19 ref
language
inglise
Kostin, S., Ubar, R., Raik, J. Defect-oriented modul-level fault diagnosis in digital circuits // Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany. [S.l.] : IEEE, 2011. p. 81-86.