Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis
statement of authorship
Hanno Hantson, Urmas Repinski, Jaan Raik, Maksim Jenihhin, Raimund Ubar
location of publication
[S.l.]
publisher
year of publication
pages
[6 p.] : ill
conference name, date
LATW 2012: 13th IEEE Latin-American Test Workshop, April 10-13, 2012
conference location
Quito, Ecuador
ISBN
978-1-4673-2356-7
notes
Bibliogr.: 13 ref
language
inglise
Hantson, H., Repinski, U., Raik, J., Jenihhin, M., Ubar, R. Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis // LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador. [S.l.] : IEEE, 2012. [6 p.] : ill.