ML-based online design error localization for RISC-V implementations
author
Selg, Hardi
Jenihhin, Maksim
Ellervee, Peeter
Raik, Jaan
statement of authorship
Hardi Selg, Maksim Jenihhin, Peeter Ellervee, Jaan Raik
source
2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) : IOLTS 2023 : July 3rd-5th, 2023, Platanias, Chania (Crete), Greece : proceedings
location of publication
Piscataway, New Jersey
publisher
IEEE
year of publication
2023
pages
7 p.
conference name, date
29th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2023, 3-5 July 2023
conference location
Chania Crete, Greece
url
https://doi.org/10.1109/IOLTS59296.2023.10224864
subject term
tehisõpe
tehisnärvivõrgud
mikroprotsessorid
arvutisüsteemid
keyword
machine learning
microprocessor architecture
neural architecture search
online design error debug
ISBN
979-835034135-5
notes
Bibliogr.: 28 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)