Simulation-based equivalence checking between IEEE 1687 ICL and RTL

statement of authorship
Aleksa Damljanovic, Artur Jutman, Michele Portolan, Ernesto Sanchez, Giovanni Squillero, Anton Tsertov
location of publication
[S.l.]
publisher
year of publication
pages
paper. 7.3, 8 p. : ill
conference name, date
2019 IEEE International Test Conference (ITC)
conference location
Washington, DC, USA
ISSN
2378-2250
ISBN
978-1-7281-4823-6
notes
Bibliogr.: 13 ref
TalTech department
language
inglise