Multiple fault testing in systems-on-chip with high-level decision diagrams
author
Ubar, Raimund-Johannes
Oyeniran, Adeboye Stephen
Schölzel, Mario
Vierhaus, Heinrich Theodor
statement of authorship
Raimund Ubar, Stephen Adeboye Oyeniran, Mario Schölzel, Heinrich T. Vierhaus
source
Proceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 2015
location of publication
Piscataway
publisher
IEEE
year of publication
2015
pages
p. 66-71 : ill
conference name, date
10th IEEE International Design & Test Symposium (IDT), 14-16 December, 2015
conference location
Dead Sea, Jordan
url
http://dx.doi.org/10.1109/IDT.2015.7396738
subject term
arvutisüsteemid
digitaaltehnika
rikked
diagnostika (tehnika)
otsustusdiagrammid
keyword
digital systems
multiple faults
fault masking
highlevel decision diagrams
ISBN
978-1-4673-9993-4
notes
Bibliogr.: 17 ref
TTÜ department
arvutitehnika instituut
language
inglise