Exact static compaction of sequential circuit tests using branch-and-bound and search state registration
author
Raik, Jaan
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
Jaan Raik, Artur Jutman, Raimund Ubar
source
ETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest
location of publication
[S.l.]
year of publication
2002
pages
p. 19-20
url
https://www.researchgate.net/publication/250423148_Exact_Static_Compaction_of_Sequential_Circuit_Tests_Using_Branch_and-Bound_and_Search_State_Registration
subject term
staatika
dünaamika (füüsika)
dünaamikatestid
testid
algoritmid
notes
Bibliogr.: 6 ref
language
inglise