Short-circuit protection circuits for silicon-carbide power transistors
author
Sadik, Diane-Perle
Colmenares, Juan
Tolstoy, Georg
Rabkowski, Jacek
statement of authorship
Diane-Perle Sadik, Juan Colmenares, Georg Tolstoy, Dimosthenis Peftitsis, Mietek Bakowski, Jacek Rabkowski, and Hans-Peter Nee
source
IEEE transactions on industrial electronics
journal volume number month
vol. 63, 4
year of publication
2016
pages
p. 1995-2004 : ill
url
https://doi.org/10.1109/TIE.2015.2506628
subject term
pooljuhid
bipolaartransistorid
rikked
keyword
bipolar junction transistor (BJT)
driver circuits
failure analysis
fault detection
fault protection
junction field-effect transistor (JFET)
power MOSFET
semiconductor device reliability
short-circuit current
silicon carbide (SiC)
wide-bandgap semiconductors
ISSN
0278-0046
notes
Bibliogr.: 53 ref
TalTech department
elektrotehnika instituut
language
inglise