Hierarchical test generation for digital circuits represented by Decision Diagrams : thesis on informatics and system engineering
author
supervisor
statement of authorship
Jaan Raik ; [supervisor Raimund Ubar]
type of dissertation
doktoritöö
university/scientific institution
Tallinna Tehnikaülikool
location of publication
Tallinn
publisher
year of publication
pages
108, [15] p. : ill
series
Theses of Tallinn Technical University. C, Thesis on informatics and system engineering, ISSN 1406-4731 ; 8
subject of form
ISBN
9985-59-249-2
notes
List of publications: 63 ref. Bibliogr. p. 103-108. Thesis (Dr. of Science in Computer Engineering) : Tallinn Technical University, 2001
Raik, Jaan, 1972-
Ubar, Raimund, 1941-
Pealkirja tõlge: Hierarhiline testigenereerimine digitaalskeemide otsustusdiagrammide mudelil
TalTech department
language
inglise
Raik, J. Hierarchical test generation for digital circuits represented by Decision Diagrams : thesis on informatics and system engineering. Tallinn : TTU Press, 2001. 108, [15] p. : ill. (Theses of Tallinn Technical University. C, Thesis on informatics and system engineering, ISSN 1406-4731 ; 8).