SiC JBS diode symmetrical voltage doubler represented as the diffusion-welded stack
author
Korolkov, Oleg
Land, Raul
Toompuu, Jana
Sleptšuk, Natalja
Rang, Toomas
statement of authorship
Oleg Korolkov, Raul Land, Jana Toompuu, Natalja Sleptsuk, Toomas Rang
source
Silicon carbide and related materials 2017 : ICSCRM 2017 : selected, peer reviewed papers from the 2017 International Conference on Silicon Carbide and related materials, September 17-22, 2017, Washington, DC, USA
location of publication
Zürich
publisher
Trans Tech Publications
year of publication
2018
pages
p. 862–865 : ill
series
Materials science forum ; 924
conference name, date
ICSCRM 2017 : Silicon carbide and related materials 2017, September 17-22, 2017
conference location
Washington, DC, USA
url
https://doi.org/10.4028/www.scientific.net/MSF.924.862
subject term
pooljuhtdioodid
dioodid
Schottky barjäär
Scopus
https://www.scopus.com/sourceid/28700
https://www.scopus.com/record/display.uri?eid=2-s2.0-85049003410&origin=inward&txGid=94311121790529c18109c5d884a7af58
quartile
Q4
category (general)
Engineering
Tehnika
Materials science
Materjaliteadus
Physics and astronomy
Füüsika ja astronoomia
category (sub)
Engineering. Mechanical engineering
Tehnika. Masinaehitus
Materials science. General materials science
Materjaliteadus. Üldine materjaliteadus
Engineering. Mechanics of materials
Tehnika. Materjalide mehaanika
Physics and astronomy. Condensed matter physics
Füüsika ja astronoomia. Kondenseeritud aine füüsika
keyword
diffusion welded stacks
SiC JBS diodes
symmetrical voltage doubler
vertical integration
ISSN
0255-5476
ISBN
978-3-0357-1145-5
notes
Bibliogr.: 3 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
Thomas Johann Seebecki elektroonikainstituut
language
inglise
Reserch Group
Cognitronic lab-on-a-chip research group
Research laboratory for cognitronics
Measurement electronics research group