Greedy alternative for the static compaction of sequential circuit test sequences
author
Raik, Jaan
statement of authorship
J.Raik
source
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
location of publication
[Tallinn]
publisher
Tallinn Technical University
year of publication
2000
pages
p. 133-136 : ill
subject term
elektriahelad
algoritmid
ISBN
9985-59-179-8
notes
Bibliogr.: 8 ref
TalTech department
arvutitehnika instituut
language
inglise