High-level design error diagnosis using backtrace on decision diagrams
author
Raik, Jaan
Repinski, Urmas
Ubar, Raimund-Johannes
Jenihhin, Maksim
Tšepurov, Anton
statement of authorship
Jaan Raik, Urmas Repinski, Raimund Ubar, Maksim Jenihhin, Anton Chepurov
source
28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers
location of publication
[S.l.]
publisher
IEEE
year of publication
2010
pages
[4] p. : ill
conference name, date
28th Norchip Conference, 15-16 November, 2010
conference location
Tampere, Finland
url
http://dx.doi.org/10.1109/NORCHIP.2010.5669486
subject term
programmeerimiskeeled
rikked
diagnostika (tehnika)
otsustusdiagrammid
ISBN
978-1-4244-8973-2
notes
Bibliogr.: 12 ref
TalTech department
arvutitehnika instituut
language
inglise