Systematic analysis of electronic devices reliability
author
Eidukas, D.
Balaišis, P.
Navikas, D.
statement of authorship
D.Eidukas, P.Balaišis, D.Navikas
source
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
publisher
Tallinn University of Technology
year of publication
1998
pages
p. 255-258: ill
subject term
elektronseadised
töökindlus
analüüs
ISBN
9985-59-081-3
notes
Bibl. 4 ref
language
inglise