Scalable algorithm for structural fault collapsing in digital circuits
author
Ubar, Raimund-Johannes
Jürimägi, Lembit
Orasson, Elmet
Raik, Jaan
statement of authorship
Raimund Ubar, Lembit Jürimägi, Elmet Orasson, Jaan Raik
source
2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea
location of publication
[S.l.]
publisher
IEEE
year of publication
2015
pages
p. 171-176 : ill
conference name, date
2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), October 5-7, 2015
conference location
Daejeon, Korea
subject term
digitaaltehnika
elektronlülitused
rikked
diagnostika (tehnika)
algoritmid
keyword
combinational circuits
fault collapsing
fault equivalence and dominance
Binary Decision Diagrams
lower and higher bounds
ISBN
978-1-4673-9140-5
notes
Bibliogr.: 24 ref
TalTech department
arvutitehnika instituut
language
inglise