Two-dimensional nonisothermal analysis of the current crowding effect at nonuniform SiC Schottky contacts using device simulator DYNAMIT-2DT
author
Kurel, Raido
Udal, Andres
statement of authorship
Raido Kurel and Andres Udal
source
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
location of publication
Tallinn
publisher
[Tallinn Technical University]
year of publication
2002
pages
p. 51-54 : ill
ISBN
9985-59-292-1
notes
Bibliogr.: 13 ref