System modelling and measurement under the view of design of testability and fault diagnosis of analog circuits
author
Liu, Ji-Gou
Frühauf, Uwe
statement of authorship
Ji-Gou Liu and Uwe Frühauf
source
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
year of publication
1996
pages
p. 295-298: ill
ISBN
9985-59-026-0
notes
Bibl. 4 ref