Ultra fast parallel fault analysis on structurally synthesized BDDs
                                            statement of authorship
                                    
                                    
Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman
                                                    
                                            
                                            location of publication
                                    
                                    
Los Alamitos
                                                    
                                            
                                            publisher
                                    
                                    
                                
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 131-136 : ill
                                                    
                                            
                                            conference name, date
                                    
                                    
12th IEEE European Test Symposium ETS 2007, 20-24 May, 2007
                                                    
                                            
                                            conference location
                                    
                                    
Freiburg, Germany
                                                    
                                            
                                            ISSN
                                    
                                    
1530-1877
                                                    
                                            
                                            ISBN
                                    
                                    
978-0-7695-2827-4
                                                    
                                            
                                            notes
                                    
                                    
Bibliogr.: 18 ref
                                                    
                                            
                                            TalTech department
                                    
                                    
                                
                                            language
                                    
                                    
inglise
                                                    
                                            
                            Ubar, R.-J., Devadze, S., Raik, J., Jutman, A. Ultra fast parallel fault analysis on structurally synthesized BDDs // 12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings. Los Alamitos : IEEE Computer Society Press, 2007. p. 131-136 : ill.