Automated area and coverage optimization of minimal latency checkers
author
Azad, Siavoosh Payandeh
Niazmand, Behrad
Apneet Kaur
Raik, Jaan
Jervan, Gert
Hollstein, Thomas
statement of authorship
Siavoosh Payandeh Azad, Behrad Niazmand, Apneet Kaur Sandhu, Jaan Raik, Gert Jervan, Thomas Hollstein
source
2017 22nd IEEE European Test Symposium (ETS 2017), Limassol, Cyprus, 22 – 26 May 2017 : proceedings
location of publication
Piscataway
publisher
IEEE
year of publication
2017
pages
p. 7-8 : ill
conference name, date
22nd IEEE European Test Symposium (ETS 2017), 22 - 26 May 2017
conference location
Limassol, Cyprus
url
https://doi.org/10.1109/ETS.2017.7968211
subject term
nanoelektroonika
rikked
ISSN
1530-1877
ISBN
978-1-5090-5458-9
notes
Bibliogr.: 5 ref
TalTech department
arvutisüsteemide instituut
language
inglise