Parallel X-fault simulation with critical path tracing technique [Electronic resource]
statement of authorship                    
                    
Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman
                            
                    
source                    
                    
DATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 2010
                            
                    
location of publication                    
                    
[Dresden]
                            
                    
publisher                    
                    
                
year of publication                    
                    
                
pages                    
                    
p. 879-884 [CD-ROM]
                            
                    
conference name, date                    
                    
DATE : Design, Automation & Test in Europe, 8-12 March, 2010
                            
                    
conference location                    
                    
Dresden, Germany
                            
                    
subject term                    
                    
                
ISBN                    
                    
978-3-9810801-6-2
                            
                    
language                    
                    
inglise
                            
                    
                            Ubar, R., Devadze, S., Raik, J., Jutman, A. Parallel X-fault simulation with critical path tracing technique [Electronic resource] // DATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 2010. [Dresden] : IEEE, 2010. p. 879-884 [CD-ROM].